By Michael Nosonovsky, Bharat Bhushan (auth.), Professor Bharat Bhushan, Professor Dr. Harald Fuchs (eds.)

The scanning probe microscopy ?eld has been quickly increasing. it's a challenging activity to assemble a well timed assessment of this ?eld with an emphasis on technical dev- opments and commercial purposes. It turned glaring whereas enhancing Vols. I–IV that an enormous variety of technical and applicational features are current and speedily - veloping world wide. contemplating the good fortune of Vols. I–IV and the truth that additional colleagues from top laboratories have been able to give a contribution their newest achie- ments, we determined to extend the sequence with articles touching ?elds now not lined within the earlier volumes. The reaction and aid of our colleagues have been first-class, making it attainable to edit one other 3 volumes of the sequence. unlike to- cal convention lawsuits, the utilized scanning probe tools intend to offer an summary of modern advancements as a compendium for either functional functions and up to date uncomplicated examine effects, and novel technical advancements with admire to instrumentation and probes. the current volumes hide 3 major components: novel probes and strategies (Vol. V), charactarization (Vol. VI), and biomimetics and commercial functions (Vol. VII). quantity V contains an summary of probe and sensor applied sciences together with built-in cantilever ideas, electrostatic microscanners, low-noise equipment and better dynamic strength microscopy innovations, high-resonance dynamic strength - croscopy and the torsional resonance strategy, modelling of tip cantilever structures, scanning probe tools, methods for elasticity and adhesion measurements at the nanometer scale in addition to optical purposes of scanning probe ideas according to near?eld Raman spectroscopy and imaging.

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183 Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices B. Gotsmann, U. Dürig . . . . . . . . . . . . 215 Applications of Heated Atomic Force Microscope Cantilevers Brent A. Nelson, William P. King . . . . . . . . . . 251 Subject Index . . . . . . . . . . . . . . . . . . . . . . . . . . fr Bharat Bhushan Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM) W 390 Scott Laboratory, 201 W. es Horacio D. gov List of Contributors – Volume VII XXXVII Sascha E.

Fr Bharat Bhushan Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM) W 390 Scott Laboratory, 201 W. es Horacio D. gov List of Contributors – Volume VII XXXVII Sascha E. de Robert A. de Ronnie T. jp Bharat Bhushan Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM) W 390 Scott Laboratory, 201 W. edu Daniel Ebeling Center for NanoTechnology (CeNTech), Heisenbergstr. ch Hendrik Hölscher Center for NanoTechnology (CeNTech), Heisenbergstr.

183 Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices B. Gotsmann, U. Dürig . . . . . . . . . . . . 215 Applications of Heated Atomic Force Microscope Cantilevers Brent A. Nelson, William P. King . . . . . . . . . . 251 Subject Index . . . . . . . . . . . . . . . . . . . . . . . . . . fr Bharat Bhushan Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM) W 390 Scott Laboratory, 201 W. es Horacio D. gov List of Contributors – Volume VII XXXVII Sascha E.

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